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    Abstract:
 Traditional non-parametric statistical learning techniques are often computationally attractive, but lack the same generalization and model selection abilities as state-of-the-art Bayesian algorithms which, however, are usually computationally prohibitive. This paper makes several important contributions that allow Bayesian learning to scale to more complex,  real-world learning scenarios. Firstly, we show that backfitting, a traditional  non-parametric, yet highly efficient regression tool can be derived in a novel formulation within an expectation maximization(EM) framework and thus can finally  be given a probabilistic interpretation. Secondly, we show that the general framework of sparse Bayesian learning and in particular the relevance vector machine (RVM), can be derived as a highly efficient algorithm using a Bayesian version of backfitting at its core. As we demonstrate on several regression  and classification benchmarks, Bayesian backfitting offers a compelling alternative to current regression methods, especially when the size and dimensionality of the data challenge computational resources. 
    Links To Paper1st Link 
    Bibtex format@InProceedings{EDI-INF-RR-0377,author	= {
  Aaron D'Souza
   and Sethu Vijayakumar
   and Stefan Schaal
},title   = {The Bayesian Backfitting Relevance Vector Machine},book title = {Proc. of International Conference on Machine Learning (ICML 2004)},publisher = {ACM Press, New York, NY, USA},year = 2004,month = {Jul},volume = {69},pages = {31},doi = {http://doi.acm.org/10.1145/1015330.1015358},url = {http://homepages.inf.ed.ac.uk/svijayak/publications/dsouza-ICML2004.pdf},} |